Student-led Conference: Functional scanning probe microscopy techniques 30-31 March 2017

Functional scanning probe microscopy techniques 30-31 March 2017

Who:  This is for postgraduate and postdoctoral researchers from the SEPnet region with research interests in this year’s conference topics.  A limited number of places are available to early stage researchers beyond the region.

When:  30-31 March 2017.  Arrival in the evening on 29 March 2017.

Where:  Building 58, Murray Lecture Theatre Complex, Highfield Campus, University of Southampton SO17 1BJ.  Free to attend.  Single en suite accomodation at the Glen Ayre Complex. Travel expenses to and from the venue can be claimed through SEPnet.

Abstract deadline 16 December 2016:   Please email your submissions to hector.corte [at] using the template here. Once your abstract has been accepted you will be notified by the conference organiser to register for this conference.

This workshop contributes 12 hours towards physics skills training.

Registration: The deadline to register is 28 February 2017.  Register here.

What:  There are two parallel research conferences proposed and organised by students wanting to advance their research and extend their collaborations. The conferences include talks by invited speakers and students as well as poster and recreational sessions.

Confirmed speakers:  Florence Marchi, Institute Néel; Ekaterina Selezneva, NPL, Charles Clifford, NPL; Sonia Antoranz Contera, Oxford University

Functional scanning probe microscopy techniques:  

The conference will be focused on sharing the different functional scanning probe microscopy techniques that PhD students use in their day-to-day. Because scanning probe microscopy is becoming a standard tool in many materials laboratories, it has seen a huge increase in the number of available techniques, with almost no time for training of new users.

Our aim is that each PhD student will be able to share their experience and at the same time will be able to learn from others. The objective is that every student attending the conference will learn at least one new technique relevant for their work.

The main topics will be general applications of atomic force microscopy (AFM), magnetic force microscopy, Kelvin microscopy, nanolithography, scanning tunneling microscopy, electrochemical AFM, force spectroscopy, and thermal AFM. Our aim is to transfer knowledge between users of the different techniques in order to make students aware of the available tools they can use in their research.

If your research involves scanning probe microscopy, then you are welcome to submit an abstract (~300 words) describing your work. Please indicate your preference for an oral presentation (15 minutes) or a poster (A1 size). Travel and accommodation expenses are fully covered by SEPnet and there is no registration fee. Please email your submissions to hector.corte [at] using the template here.

We look forward to hearing from you!

Organisers: Héctor Corte-León (RHUL) Alex Browning (Surrey)

(The parellel session is “A Broadband Look at Astrophysical Processes “.  This meeting will take a broadband look at astrophysical processes across the electromagnetic spectrum.  By introducing different features of the electromagnetic spectrum in an astrophysical context, it will create a foundation for broadband study at different wavebands. Organisers: Peter Boorman, Bella Boulderstone and Chris Frohmaier  (Soton.)